ADRIAN BIRCHER BELICHTUNGSMESSUNG PDF

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Toggle navigation. Crystallography and Crystal Defects Anthony A. Kelly , Kevin M. Knowles The aim of this new edition of Crystallography and Crystal Defects is to communicate the modern concepts of crystallography in a clear, succinct, manner and to put these concepts into use in the description of line and planar defects in crystalline materials, quasicrystals and crystal interfaces.

Since the first edition of this book, understanding of crystal defects such as dislocations, stacking faults, twin, grain and interphase boundaries and their effect on the mechanical and electrical properties of materials has grown enormously, and this has been accompanied by a total change in style of the way in which both research and teaching are carried out through the use of the fast digital computer.

This new edition takes account of this change and a number of new topics are included, for example piezoelectricity, liquid crystals, nanocrystalline concepts, incommensurate materials and the structure of foamed and amorphous materials. The topic of quasicrystalline materials has been completely rewritten, and the data tables and references have been fully updated. Reinforcing its unrivalled position as the core text for teaching crystallography and crystal defects, each chapter includes problem sets with brief numerical solutions at the end of the book.

Detailed worked solutions, supplementary lecture material and computer programs for crystallographic calculations are provided online. ISBN Send-to-Kindle or Email Please login to your account first Need help?

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Verlag Photographie, Gilching. Adrian Bircher. Nina Berova , Prasad L. Polavarapu , Koji Nakanishi , Robert W. Korrekt messen, richtig belichten. Verlag Photographie, Gilching Adrian Bircher.

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Belichtungsmessung. Korrekt messen, richtig belichten

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